X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials

X-ray microanalysis of porous materials using Monte Carlo simulations.

Quantitative X-ray microanalysis models, such as ZAF or φ(ρz) methods, are normally based on solid, flat-polished specimens. This limits their use in various domains where porous materials are studied, such as powder metallurgy, catalysts, foams, etc. Previous experimental studies have shown that an increase in porosity leads to a deficit in X-ray emission for various materials, such as graphit...

X-Ray microanalysis of stratified specimens

This paper presents a description of the state of the art methodology and software for the application of x-ray microanalysis to thin surface layers and more generally to the characterization of stratified specimens. The sensitivity of the technique to near-surface segregation is demonstrated. Some emphasis is given on the eS(pz) function (the distribution in depth of the primary generated x-ra...

Optimum driving a Z-pinch for soft X-Ray lasers

A capillary plasma z-pinch as an alternative active medium of soft X-Ray lasers was studied experimentally and theoretically. The theoretical analysis was based on the self consistent solution of the so called “snow plow” model. The dynamics of pinched plasma is determined by the capillary parameters and by the time dependence of electrical current passing through it. The current time dependenc...

X-ray microanalysis attachment for electron microscope.

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...